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Test & Measurement
35 results found for Test & Measurement, displaying items 1 - 20

 
October 9, 2008   [From The Digital Edition: News]
WiMAX Turnkey Test Solution
Munich, Germany: Rohde & Schwarz (R&S) and Beceem Communications jointly developed a custom test solution for Beceem’s mobile WiMAX chipsets that’s based on the R&S CMW270 WiMAX communication tester...  — Paul Whytock

March 27, 2008   [Editorial]
Visionary Technologists
There are times when human imagination and expertise, coupled with the enabling effect of advanced electronics technology, can create something really important for people.  — Paul Whytock

February 12, 2008   [Editorial]
Finding The Right Words
A well-known media industry newsletter recently ran an editorial comment questioning why editorial policies of US and European electronics magazines should differ so much when it comes to sourcing technical articles.  — Paul Whytock

January 10, 2008   [Web Exclusive]
Tester Targets Wireless Devices Up To 6 GHz
To help facilitate the production of wireless devices, Rohde & Schwarz came up the CMW500 non-signaling tester.  — Staff

December 6, 2007   [News Feature]
Stronger Than the Slowest Link
 — Trevor Smith

November 22, 2007   [Cover Feature]
Keeping Troops Out of Harm’s Way, Technically Speaking
 — John Edwards

October 11, 2007   [What's New]
GO ONLINE FOR YOUR POWER DESIGN DECISIONS
 — Staff

September, 13 2007   [News Feature]
Simple Additions to Audio Amplifier Prevent Clipping at Higher Inputs
 — John Guy

October 24, 2007   [Web Exclusive]
LabVIEW Embedded Platform Widens Its Scope
National Instruments extended the NI LabVIEW 8.5 graphical system design platform to new embedded targets with the release of the NI LabVIEW Embedded Module for ADI Blackfin Processors 2.5 and the LabVIEW Microprocessor SDK (Software Development Kit) 2.5.  — Staff

May 24, 2006   [Direct Feature]
Memory Test and Programming Via Boundary Scan
 — James Stanbridge

November 22, 2006   [Upfront]
Test Identifies Failed Vias
 — Paul Whytock

February 22, 2007   [What's New]
Embedded analyser kit handles communications debugging
 — Paul Whytock

April 26, 2007   [What's New]
New features enrich power-analyser capability
 — Paul Whytock

May 10, 2007   [Upfront]
45nm LSI breakthrough: 1nm-level analysis
 — Paul Whytock

June 7, 2007   [What's New]
DCPS Function at +125°C Levels
 — Paul Whytock

July 19, 2007   [What's New]
Microwave mixer modules deliver reliability
 — Paul Whytock

July 5, 2007   [What's New]
Instrument-in-a-box adds signal analysis
 — Paul Whytock

December 6, 2006   [Web Exclusive]
Data engine a real eye opener
A new type of waveform accumulation enhances how eye diagrams are displayed.  — Clive Davis

October 11, 2006   [Web Exclusive]
Flexible battery-life testing for TETRA radios
The TETRA Energy Economy Mode (EEM) option is now available for Aeroflex's 3900 Series of analog and digital radio test sets.  — Paul Whytock

September 27, 2006   [Web Exclusive]
Scope performs automated USB tests
Yokogawa's busXplorerUSB is a compact USB 2.0 compliance test solution based on the company's DL9240/9240L family of high-performance digital oscilloscopes.  — Paul Whytock





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